IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wireless, the way to conduct testing and diagnostics

IEEE Autotestcon 2007. Systems Readiness Technology Conference

Author(s): Thuan Khong ; J. Burgess ; Tien Chau ; P. Carnes ; J. Delaney
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Baltimore, MD, USA
Conference Date: 17 September 2007
Page(s): 692 - 700
ISBN (CD): 978-1-4244-1239-6
ISBN (Paper): 978-1-4244-1238-9
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2007.4374286
Regular:

The product director test measurement and diagnostic equipment (PD TMDE) current and emerging products enable condition based maintenance (CBM), real-time platform test and diagnostics, vehicle... View More

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