IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of blind deconvolution de-noising scheme in failure prognosis

IEEE Autotestcon 2007. Systems Readiness Technology Conference

Author(s): B. Zhang ; T. Khawaja ; R. Patrick ; G. Vachtsevanos ; M. Orchard ; A. Saxena
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Baltimore, MD, USA
Conference Date: 17 September 2007
Page(s): 561 - 566
ISBN (CD): 978-1-4244-1239-6
ISBN (Paper): 978-1-4244-1238-9
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2007.4374268
Regular:

Fault diagnosis and failure prognosis are essential techniques to improve the safety of many mechanical systems. However, vibration signals are often corrupted by noise and, therefore, the... View More

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