IEEE - Institute of Electrical and Electronics Engineers, Inc. - Obsolescense mitigation and management of electronics test equipment

IEEE Autotestcon 2007. Systems Readiness Technology Conference

Author(s): B. Frank ; R.L. Morgan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Baltimore, MD, USA
Conference Date: 17 September 2007
Page(s): 527 - 536
ISBN (CD): 978-1-4244-1239-6
ISBN (Paper): 978-1-4244-1238-9
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2007.4374264
Regular:

The US Army Aviation and Missile Research, Development, and Engineering Center (AMRDEC) Engineering Support (ES) Division and the Integrated Materiel Management Center (IMMC), located on Redstone... View More

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