IEEE - Institute of Electrical and Electronics Engineers, Inc. - ICA through an LS-SVM based Kernel CCA Measure for Independence

International Joint Conference on Neural Networks

Author(s): C. Alzate ; J.A.K. Suykens
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Orlando, FL, USA
Conference Date: 12 August 2007
Page(s): 2,920 - 2,925
ISBN (CD): 978-1-4244-1380-5
ISBN (Paper): 978-1-4244-1379-9
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2007.4371424
Regular:

A new measure for independence based on canonical correlation in high dimensional feature spaces is presented. This measure can be used as a contrast function for independent component analysis... View More

Advertisement