IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Face Matching Under Large Occlusions

2007 14th International Conference on Image Analysis and Processing - ICIAP 2007

Author(s): G. Gimel'farb ; P. Delmas ; J. Morris ; A. Shorin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Modena, Italy
Conference Date: 10 September 2007
Page(s): 448 - 453
ISBN (Paper): 978-0-7695-2877-9
DOI: 10.1109/ICIAP.2007.4362819
Regular:

Outliers due to occlusions and contrast and offset signal deviations notably hinder recognition and retrieval of facial images. We propose a new maximum likelihood matching score with "soft... View More

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