IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction

2007 IEEE International Conference on Software Maintenance

Author(s): S. McMaster ; A. Memon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Paris, France
Conference Date: 2 October 2007
Page(s): 335 - 344
ISBN (CD): 978-1-4244-1256-3
ISBN (Paper): 978-1-4244-1255-6
ISSN (Paper): 1063-6773
DOI: 10.1109/ICSM.2007.4362646
Regular:

Test suite reduction seeks to reduce the number of test cases in a test suite while retaining a high percentage of the original suite's fault detection effectiveness. Most approaches to this... View More

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