IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel Active Contour Model algorithm for contour detection in complex objects

2007 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications

Author(s): G. Gargano ; R. Bellotti ; F. De Carlo ; S. Tangaro ; E. Tommasi ; M. Castellano ; P. Cerello ; S.C. Cheran ; C. Fulcheri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Ostuni, Italy
Conference Date: 27 June 2007
Page(s): 49 - 53
ISBN (CD): 978-1-4244-0824-5
ISBN (Paper): 978-1-4244-0823-8
DOI: 10.1109/CIMSA.2007.4362537
Regular:

A new active contour model (ACM) algorithm for the detection of the contour of bi-dimensional regions is presented. The algorithm is based on the simulation of an elastic band glued to the contour... View More

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