IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel Active Contour Model algorithm for contour detection in complex objects
2007 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
Author(s): | G. Gargano ; R. Bellotti ; F. De Carlo ; S. Tangaro ; E. Tommasi ; M. Castellano ; P. Cerello ; S.C. Cheran ; C. Fulcheri |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 June 2007 |
Conference Location: | Ostuni, Italy |
Conference Date: | 27 June 2007 |
Page(s): | 49 - 53 |
ISBN (CD): | 978-1-4244-0824-5 |
ISBN (Paper): | 978-1-4244-0823-8 |
DOI: | 10.1109/CIMSA.2007.4362537 |
Regular:
A new active contour model (ACM) algorithm for the detection of the contour of bi-dimensional regions is presented. The algorithm is based on the simulation of an elastic band glued to the contour... View More