IEEE - Institute of Electrical and Electronics Engineers, Inc. - "Rationalizing the Home Front: The Cold War, The Nevada Test Site, and Radiation Exposure"

2007 International Symposium on Technology and Society: Risk, Uncertainty, Vulnerability, Technology and Society

Author(s): L.A. Carr
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Las Vegas, NV, USA
Conference Date: 1 June 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-0587-9
ISBN (Paper): 978-1-4244-0586-2
DOI: 10.1109/ISTAS.2007.4362210
Regular:

Beginning in 1953, radiation exposure and its effects became a hotly contested issue between the government, members of communities surrounding the Nevada Test Site (NTS), and researchers within... View More

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