IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hierarchical Means: Single Number Benchmarking with Workload Cluster Analysis

2007 IEEE International Symposium on Workload Characterization

Author(s): R.M. Yoo ; H.-H.S. Lee ; Han Lee ; Kingsum Chow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Boston, MA, USA
Conference Date: 27 September 2007
Page(s): 204 - 213
ISBN (CD): 978-1-4244-1562-5
ISBN (Paper): 978-1-4244-1561-8
DOI: 10.1109/IISWC.2007.4362196
Regular:

Benchmark suite scores are typically calculated by averaging the performance of each individual workload. The scores are inherently affected by the distribution of workloads. Given the... View More

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