IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Statistical Sampling in Microarchitecture Simulation: Metric, Methodology and Program Characterization

2007 IEEE International Symposium on Workload Characterization

Author(s): S.V. Kodakara ; J. Kim ; D.J. Lilja ; Wei-Chung Hsu ; Pen-Chung Yew
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Boston, MA, USA
Conference Date: 27 September 2007
Page(s): 139 - 148
ISBN (CD): 978-1-4244-1562-5
ISBN (Paper): 978-1-4244-1561-8
DOI: 10.1109/IISWC.2007.4362190
Regular:

Statistical sampling, especially stratified random sampling, is a promising technique for estimating the performance of the benchmark program without executing the complete program on... View More

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