IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quantitative analysis of in-field defects in image sensor arrays

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): J. Leung ; J. Dudas ; G.H. Chapman ; I. Koren ; Z. Koren
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 526 - 534
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.59
Regular:

Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us sufficient data... View More

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