IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): J. Dudas ; M.L. La Haye ; J. Leung ; G.H. Chapman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 517 - 525
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.53
Regular:

Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade the dynamic... View More

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