IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing Reversible One-Dimensional QCA Arrays for Multiple F

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): J. Huang ; X. Ma ; C. Metra ; F. Lombardi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 469 - 477
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.17
Regular:

Reversible logic design is a well-known paradigm in digital computation. In this paper, quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic in... View More

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