IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-Concurrent On-Line Testing of Transition Faults Through Output Response Comparison of Identical Circuits
2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Author(s): | I. Pomeranz ; S.M. Reddy |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 September 2007 |
Conference Location: | Rome, Italy |
Conference Date: | 26 September 2007 |
Page(s): | 457 - 468 |
ISBN (Paper): | 978-0-7695-2885-4 |
ISSN (Paper): | 1550-5774 |
DOI: | 10.1109/DFT.2007.10 |
Regular:
We describe a method for on-line testing of delay faults based on the comparison of output responses of identical circuits. The method allows one of the circuits to participate in useful... View More