IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-Concurrent On-Line Testing of Transition Faults Through Output Response Comparison of Identical Circuits

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): I. Pomeranz ; S.M. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 457 - 468
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.10
Regular:

We describe a method for on-line testing of delay faults based on the comparison of output responses of identical circuits. The method allows one of the circuits to participate in useful... View More

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