IEEE - Institute of Electrical and Electronics Engineers, Inc. - High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): M. Favalli ; M. Dalpasso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 448 - 456
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.19
Regular:

The growing dispersion of parameters in CMOS ICs poses relevant uncertainties on gate output conductances and logic thresholds that affect bridging fault (BF) detection. To analyze the quality of... View More

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