IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hierarchical Fault Compatibility Identification for Test Generation with a Small Number of Specified Bits

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): S. Neophytou ; M.K. Michael
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 439 - 447
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.46
Regular:

Identification of bits that do not necessarily have to be specified in a test set can be beneficial to a number of applications, including low power test, test set encoding and embedding, and test... View More

Advertisement