IEEE - Institute of Electrical and Electronics Engineers, Inc. - RAM-based fault tolerant state machines for FPGAs

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): L. Frigerio ; F. Salice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 312 - 320
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.33
Regular:

The paper presents a solution to protect FSM implemented on FPGAs from SEU, exploiting the embedded memories available in modern FPGA devices and a Hamming code for error detection and correction.... View More

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