IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): J. Semiao ; J.J. Rodriguez-Andina ; F. Vargas ; M.B. Santos ; I.C. Teixeira ; J.P. Teixeira
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 303 - 311
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.60
Regular:

A new methodology is proposed to increase the robustness of pipeline-based circuits. The goal is to improve signal integrity in the presence of power-supply voltage (VDD) and/or... View More

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