IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): J. Lagos-Benites ; D. Appello ; P. Bernardi ; M. Grosso ; D. Ravotto ; E. Sanchez ; M.S. Reorda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 291 - 302
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.47
Regular:

In this paper, a Software-Based Diagnosis (SBD) procedure suitable for SoCs is proposed to tackle the diagnosis of transition-delay faults. The illustrated methodology takes advantage of an... View More

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