IEEE - Institute of Electrical and Electronics Engineers, Inc. - A-Diagnosis: A Complement to Z-Diagnosis

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): I. Pomeranz ; S.M. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 235 - 242
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.9
Regular:

Z-diagnosis was proposed for speeding up diagnostic fault simulation by identifying in an efficient manner fault pairs that are guaranteed to be distinguished by a fault detection test set.... View More

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