IEEE - Institute of Electrical and Electronics Engineers, Inc. - Timing-Aware Diagnosis for Small Delay Defects

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): T. Aikyo ; H. Takahashi ; Y. Higami ; J. Ootsu ; K. Ono ; Y. Takamatsu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 223 - 234
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.30
Regular:

As semiconductor technologies progress, testing of small delay defects are becoming more important for SoCs. However, fault diagnosis of small delay defects has not been developed. We propose a... View More

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