IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical Analysis of the Dependence of Test Power, Delay, Energy and Fault Coverage on the Architecture of LFSR-Based TPGs

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): M. Kamal ; S. Koohi ; S. Hessabi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 179 - 187
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
Regular:

Power dissipation, energy consumption of CUT and also number of required test vectors for obtaining predetermined fault coverage are the most important criteria used for evaluating the quality of... View More

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