IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparing fail-safe microcontroller architectures in light of IEC 61508

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): R. Mariani ; P. Fuhrmann
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 123 - 131
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.63
Regular:

In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized... View More

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