IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimization of Self Checking FIR filters by means of Fault Injection Analysis

2007 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Author(s): S. Pontarelli ; L. Sterpone ; G.C. Cardarilli ; M. Re ; M.S. Reorda ; A. Salsano ; M. Violante
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 26 September 2007
Page(s): 96 - 104
ISBN (Paper): 978-0-7695-2885-4
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2007.23
Regular:

In this paper the design of a FIR filter with self checking capabilities based on the residue checking is analyzed. Usually the set of residues used to check the consistency of the results of the... View More

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