IEEE - Institute of Electrical and Electronics Engineers, Inc. - Operation of a Work Function Type SOI Temperature Sensor up to 250-¦C

2007 IEEE International SOI Conference

Author(s): K. Sakurano ; H. Katoh ; Y.J. Chun ; H. Watanabe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Indian Wells, CA, USA
Conference Date: 1 October 2007
Page(s): 149 - 150
ISBN (CD): 978-1-4244-0880-1
ISBN (Paper): 978-1-4244-0879-5
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.2007.4357896
Regular:

Bulk-Si ICs cannot operate over 150degC, due to the reverse bias leakage current of the p-n junction in MOSFETs or diode components. In this paper, we investigated a work function type temperature... View More

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