IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the FinFET parasitics for improved RF performances

2007 IEEE International SOI Conference

Author(s): B. Parvais ; M. Dehan ; V. Subramanian ; A. Mercha ; K.T. San ; M. Jurczak ; G. Groeseneken ; W. Sansen ; S. Decoutere
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Indian Wells, CA, USA
Conference Date: 1 October 2007
Page(s): 37 - 38
ISBN (CD): 978-1-4244-0880-1
ISBN (Paper): 978-1-4244-0879-5
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.2007.4357841
Regular:

FinFET architecture results in high level of parasitics that offset the performance gain that can be achieved through gate length scaling. In this work, we investigate technological solutions both... View More

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