IEEE - Institute of Electrical and Electronics Engineers, Inc. - A QoS Evaluation Testbed for Mac Protocols for Wireless Camera Networks

2007 First ACM/IEEE International Conference on Distributed Smart Cameras

Author(s): P.J. Shin ; J. Park ; A.C. Kak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Vienna, Austria
Conference Date: 25 September 2007
Page(s): 235 - 242
ISBN (CD): 978-1-4244-1354-6
ISBN (Paper): 978-1-4244-1353-9
DOI: 10.1109/ICDSC.2007.4357529
Regular:

Existing QoS metrics can only be used for wireless sensor networks when the capability of sensor nodes is limited to making simple measurements such as temperature, pressure, etc. These metrics do... View More

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