IEEE - Institute of Electrical and Electronics Engineers, Inc. - The New Technology Evaluation Based on Rough-Set Theory

PICMET '07. 2007 Portland International Conference on Management of Engineering and Technology

Author(s): Lu Wen-Guang ; Huang Lu-Cheng ; Wang Ji-wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Portland, OR, USA
Conference Date: 5 August 2007
Page(s): 883 - 886
ISBN (CD): 978-1-8908-4315-1
DOI: 10.1109/PICMET.2007.4349405
Regular:

This paper proposed the index system of new technology evaluation on the basis of commercial potential by expert panel. And rough set theory was used to reduce proposed index and determine the... View More

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