IEEE - Institute of Electrical and Electronics Engineers, Inc. - Integration and Test of a 2nd Generation Dual Purpose Pulse Forming Network into the P&E HWIL SIL

2007 IEEE Pulsed Power Plasma Science Conference

Author(s): J. White ; G. Danielson ; J. Paschen ; E.J. Barshaw ; G. Frazier ; B. Dixon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 17 June 2007
Page(s): 795
ISBN (Paper): 978-1-4244-0915-0
ISSN (Paper): 0730-9244
DOI: 10.1109/PPPS.2007.4346101
Regular:

A 2nd generation dual purpose pulse forming network (DP-PFN) has been developed to power both the electro-thermal-chemical (ETC)/electro-thermal-ignition (ETI) lethality capability... View More

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