IEEE - Institute of Electrical and Electronics Engineers, Inc. - Shot Noise of High Current Electron Field Emission

2007 IEEE Pulsed Power Plasma Science Conference

Author(s): L.K. Ang ; L. Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 17 June 2007
Page(s): 580
ISBN (Paper): 978-1-4244-0915-0
ISSN (Paper): 0730-9244
DOI: 10.1109/PPPS.2007.4345886
Regular:

Summary form only given. This paper presents the importance of space charge effects on the shot noise for electron field emission, in classical, quantum, and relativistic regimes. The Fano factor... View More

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