IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparative Assessment of Testing and Model Checking Using Program Mutation

Testing: Academic and Industrial Conference - Practice and Research Techniques

Author(s): J.S. Bradbury ; J.R. Cordy ; J. Dingel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Windsor, UK
Conference Date: 10 September 2007
Page(s): 210 - 222
ISBN (Paper): 978-0-7695-2984-4
DOI: 10.1109/TAIC.PART.2007.37
Regular:

Developing correct concurrent code is more difficult than developing correct sequential code. This difficulty is due in part to the many different, possibly unexpected, executions of the program,... View More

Advertisement