IEEE - Institute of Electrical and Electronics Engineers, Inc. - How good are your testers? An assessment of testing ability

Testing: Academic and Industrial Conference - Practice and Research Techniques

Author(s): Liang Huang ; C. Thomson ; M. Holcombe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Windsor, UK
Conference Date: 10 September 2007
Page(s): 82 - 88
ISBN (Paper): 978-0-7695-2984-4
DOI: 10.1109/TAIC.PART.2007.16
Regular:

During our previous research conducted in the Sheffield Software Engineering Observatory [11], we found that test first programmers spent a higher percentage of their time testing than those... View More

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