IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fast Multi-pattern Matching Algorithm for Deep Packet Inspection on a Network Processor

2007 International Conference on Parallel Processing

Author(s): Jia Ni ; Chuang Lin ; Zhen Chen ; P. Ungsunan
Sponsor(s): Int. Assoc. Comput. Commun.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Xi'an, China
Conference Date: 10 September 2007
Page(s): 16
ISBN (CD): 978-0-7695-2933-2
ISSN (Paper): 0190-3918
DOI: 10.1109/ICPP.2007.7
Regular:

Deep Packet Inspection (DPI) is a critical function in network security applications such as Firewalls and Intrusion Detection Systems (IDS). Signature based scanners used in DPI apply... View More

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