IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of Outlier Detection Methods in Fault-proneness Models
2007 First International Symposium on Empirical Software Engineering and Measurement
Author(s): | S. Matsumoto ; Y. Kamei ; A. Monden ; K. Matsumoto |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 September 2007 |
Conference Location: | Madrid, Spain |
Conference Date: | 20 September 2007 |
Page(s): | 461 - 463 |
ISBN (CD): | 978-0-7695-2886-1 |
ISSN (Paper): | 1938-6451 |
DOI: | 10.1109/ESEM.2007.83 |
Regular:
In this paper, we experimentally evaluated the effect of outlier detection methods to improve the prediction performance of fault-proneness models. Detected outliers were removed from a fit... View More