IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of Outlier Detection Methods in Fault-proneness Models

2007 First International Symposium on Empirical Software Engineering and Measurement

Author(s): S. Matsumoto ; Y. Kamei ; A. Monden ; K. Matsumoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Madrid, Spain
Conference Date: 20 September 2007
Page(s): 461 - 463
ISBN (CD): 978-0-7695-2886-1
ISSN (Paper): 1938-6451
DOI: 10.1109/ESEM.2007.83
Regular:

In this paper, we experimentally evaluated the effect of outlier detection methods to improve the prediction performance of fault-proneness models. Detected outliers were removed from a fit... View More

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