IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

2007 IEEE Radiation Effects Data Workshop

Author(s): M.V. O'Bryan ; C.F. Poivey ; K.A. LaBel ; S.P. Buchner ; R.L. Ladbury ; T.R. Oldham ; J.W. Howard ; A.B. Sanders ; M.D. Berg ; J.L. Titus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Honolulu, HI, USA
Conference Date: 23 July 2007
Page(s): 153 - 161
ISBN (Paper): 978-1-4244-1464-2
ISSN (Electronic): 2154-0535
ISSN (Paper): 2154-0519
DOI: 10.1109/REDW.2007.4342557
Regular:

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital, linear, and hybrid devices.

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