IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compendium of Current Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

2007 IEEE Radiation Effects Data Workshop

Author(s): D.J. Cochran ; S.P. Buchner ; C. Poivey ; K.A. LaBel ; R.L. Ladbury ; M. O'Bryan ; J.W. Howard ; A. Sanders ; T. Oldham
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Honolulu, HI, USA
Conference Date: 23 July 2007
Page(s): 146 - 152
ISBN (Paper): 978-1-4244-1464-2
ISSN (Electronic): 2154-0535
ISSN (Paper): 2154-0519
DOI: 10.1109/REDW.2007.4342556
Regular:

Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar... View More

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