IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bipolar Phototransistors Reliability Assessment for Space Applications

2007 IEEE Radiation Effects Data Workshop

Author(s): O. Gilard ; G. Quadri ; P. Spezzigu ; J.L. Roux
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Honolulu, HI, USA
Conference Date: 23 July 2007
Page(s): 85 - 91
ISBN (Paper): 978-1-4244-1464-2
ISSN (Electronic): 2154-0535
ISSN (Paper): 2154-0519
DOI: 10.1109/REDW.2007.4342545
Regular:

Life test, total dose and proton irradiations were performed on silicon-based bipolar phototransistors. A high radiation sensitivity was observed together with abnormal fluctuations of... View More

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