IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Two-Step Model for Defect Density Estimation

EUROMICRO '07. 2007 33rd Euromicro Conference on Software Engineering and Advanced Applications

Author(s): O. Kutlubay ; B. Turhan ; A.B. Bener
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 28 August 2007
Page(s): 322 - 332
ISBN (Paper): 978-0-7695-2977-6
ISSN (Paper): 1089-6503
DOI: 10.1109/EUROMICRO.2007.13
Regular:

Identifying and locating defects in software projects is a difficult task. Further, estimating the density of defects is more difficult. Measuring software in a continuous and disciplined manner... View More

Advertisement