IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extended Fault Detection Techniques for Systems-on-Chip

2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Author(s): P. Bernardi ; L. Bolzani ; M.S. Reorda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Krakow, Poland
Conference Date: 11 April 2007
Page(s): 1 - 6
ISBN (CD): 1-4244-1162-9
ISBN (Paper): 1-4244-1161-0
DOI: 10.1109/DDECS.2007.4295254
Regular:

The adoption of systems-on-chip (SoCs) in different types of applications represents an attracting solution. However, the high integration level of SoCs increases the sensitivity to transient... View More

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