IEEE - Institute of Electrical and Electronics Engineers, Inc. - Major Circuit Yield Improvement: Yours for the Price of Minor Resistor Redesign

Author(s): W. Jacobs ; T. Hitch
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1982
Volume: 5
Page(s): 388 - 394
ISSN (Paper): 0148-6411
DOI: 10.1109/TCHMT.1982.1135981
Regular:

A method has been developed to optimize thick film resistor geometries for maximum manufacturing yield by utilizing the mathematics of the normal distribution curve. Use of the method introduces... View More

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