IEEE - Institute of Electrical and Electronics Engineers, Inc. - Major Circuit Yield Improvement: Yours for the Price of Minor Resistor Redesign
Author(s): | W. Jacobs ; T. Hitch |
Sponsor(s): | IEEE |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 December 1982 |
Volume: | 5 |
Page(s): | 388 - 394 |
ISSN (Paper): | 0148-6411 |
DOI: | 10.1109/TCHMT.1982.1135981 |
Regular:
A method has been developed to optimize thick film resistor geometries for maximum manufacturing yield by utilizing the mathematics of the normal distribution curve. Use of the method introduces... View More