IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mechanisms for Temperature Decay in the Freely Recovering Gas Blast Arc

Author(s): E. Richley ; D. T. Tuma
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1982
Volume: 10
Page(s): 2 - 7
ISSN (Paper): 0093-3813
ISSN (Online): 1939-9375
DOI: 10.1109/TPS.1982.4316125
Regular:

Energy loss mechanisms for the extinguished gas blast arc channel in free recovery are defined and their comparative magnitudes are explored for both N2 and SF6 gases. The arc channel temperature... View More

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