IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation Fidelity Issues for SREMP or SGEMP Tests

Author(s): Thomas A. Tumolillo ; John P. Wondra
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1982
Volume: 29
Page(s): 2,107 - 2,114
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1982.4336505
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