IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hardness Assurance and Overtesting

Author(s): A. I. Namenson
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1982
Volume: 29
Page(s): 1,821 - 1,826
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1982.4336454
Regular:

A procedure is developed for estimating the advantage gained by testing electronic piece parts at levels of radiation higher than the specification level which they must survive. When the... View More

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