IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation Response of Advanced Dynamic Random Access Memories (DRAMs)

Author(s): A. A. Witteles ; H. Volmerange
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1982
Volume: 29
Page(s): 1,665 - 1,668
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1982.4336424
Regular:

The radiation response of ten types of NMOS dynamic RAMs (DRAMs) was studied in a total dose and prompt dose rate environment. The test ensemble represented a cross section of state-of-the-art... View More

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