IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nondestructive Laser Method for Measuring Charge Profiles in Irradiated Polymer Films

Author(s): Gerhard M. Sessler ; James E. West ; Reimund Gerhard-Multhaupt ; Heinz von Seggern
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1982
Volume: 29
Page(s): 1,644 - 1,649
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1982.4336420
Regular:

Relative charge-density distributions in the thickness direction of thin (>10μm) polymer films are determined directly and accurately with a new laser-induced pressure-pulse (LIPP) method:... View More

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