IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlation between DLTS-Measurements and the Performance of High Purity Germanium Detectors

Author(s): E. Simoen ; P. Clauws ; J. Broeckx ; J. Vennik ; M. Van Sande ; L. De Laet
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1982
Volume: 29
Page(s): 789 - 792
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1982.4335960
Regular:

Deep acceptor levels in high-purity detector-grade Germanium (p-type) were studied by Deep Level Transient Spectroscopy (DLTS). A correlation was found between the total concentration of... View More

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