IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation method of device noise figure and gain through noise measurements

Author(s): Y. Sawayama ; K. Mishima
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1981
Volume: 69
Page(s): 1,578 - 1,579
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/PROC.1981.12205
Regular:

A new method of evaluating the noise figure and available gain of a linear two-port device only from noise measurements is proposed. In this method, there is no need for tuning at the output port... View More

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