IEEE - Institute of Electrical and Electronics Engineers, Inc. - Information System View of Biometric Analysis

2006 IEEE International Conference on Management of Innovation and Technology

Author(s): M.P. Dale ; K.H. Munde ; R.M. Bodade ; N. Kapoor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2006
Conference Location: Singapore, China, Singapore
Conference Date: 21 June 2006
Volume: 2
Page(s): 960 - 964
ISBN (CD): 1-4244-0148-8
ISBN (Paper): 1-4244-0147-X
DOI: 10.1109/ICMIT.2006.262364
Regular:

Up till now, biometric techniques used for unique identification of person had not taken into account the local environmental factors corresponding to the system. The local environmental factors... View More

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