IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault-Tolerant Scheme for Complex Transaction Patterns in J2EE

2006 10th IEEE International Enterprise Distributed Object Computing Conference

Author(s): Zuo Lin ; Liu Shaohua ; Wei Jun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Hong Kong, China
Conference Date: 16 October 2006
Page(s): 165 - 174
ISBN (Paper): 0-7695-2558-X
ISSN (Paper): 1541-7719
DOI: 10.1109/EDOC.2006.8
Regular:

End-to-end reliability is an important issue in building large-scale distributed enterprise applications based on multi-tier architecture, but the support of reliability as adopted in conventional... View More

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