IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scan-Based Delay Fault Tests for Diagnosis of Transition Faults

2006 21st IEEE International Symposium On Defect and Fault Tolerance in VLSI Systems

Author(s): I. Pomeranz ; S.M. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Arlington, VA, USA
Conference Date: 4 October 2006
Page(s): 419 - 427
ISBN (Paper): 0-7695-2706-X
ISSN (Online): 1550-5774
DOI: 10.1109/DFT.2006.56
Regular:

This paper studies the effect of the type of scan-based delay fault tests used for a circuit on the ability to diagnose delay defects by studying its effect on diagnosis of transition faults. The... View More

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